Browsing by Author Zhang, Jiayang

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 1 to 20 of 26  next >
Issue DateTitleAuthor(s)
Aug-2021Activity of preclinical and phase I clinical trial of a novel androgen receptor antagonist GT0918 in metastatic breast cancerLi, Huiping; Song, Guohong; Zhou, Qiaoxia; Ran, Ran; Jiang, Hanfang; Zhang, Ruyan; Liu, Yaxin; Zhang, Jiayang; Meng, Luping; Ma, Liandong; Sun, Ye; Wang, Meiyu; Zhou, Qingqing; Yan, Honghua; Zhou, Qianxiang; Dong, Xunwei; Tong, Youzhi
Feb-2023Adaptive Multioutput Gradient RBF Tracker for Nonlinear and Nonstationary RegressionSun, Zixuan; Wang, Zirui; Wang, Runsheng; Zhang, Lining; Zhang, Jiayang; Zhang, Zuodong; Song, Jiahao; Wang, Da; Ji, Zhigang; Huang, Ru
Sep-2021Aging-Aware Gate-Level Modeling for Circuit Reliability AnalysisZhang, Zuodong; Wang, Runsheng; Shen, Xuguang; Wu, Dehuang; Zhang, Jiayang; Zhang, Zhe; Wang, Joddy; Huang, Ru
3-Jan-2025Anlotinib in combination with metronomic chemotherapy in HER2-negative metastatic breast cancer: an observational and retrospective studyLiu, Jiaxuan; Zhang, Jiayang; Li, Huiping; Song, Guohong; Di, Lijun; Jiang, Hanfang; Yan, Ying; Wang, Huan; Wang, Jing; Liu, Xiaoran; Shao, Bin; Li, Qiao
Jan-2022Body Bias Dependence of Bias Temperature Instability (BTI) in Bulk FinFET TechnologyZhang, Jiayang; Wang, Zirui; Wang, Runsheng; Sun, Zixuan; Huang, Ru
2018Body Bias Dependence of Hot Carrier Degradation (HCD) in Advanced FinFET TechnologyZhang, Jiayang; Sun, Zixuan; Wang, Runsheng; Yu, Zhuoqing; Ren, Pengpeng; Huang, Ru
2020CIRCUIT RELIABILITY EVALUATION OF APPROXIMATE COMPUTINGZhang, Yuwei; Zhang, Zuodong; Zhang, Zhe; Zhang, Jiayang; Wang, Runsheng; Ling, Zhiting; Huang, Ru
2018Compact Modeling and Simulation of Accelerated Circuit AgingPatra, Devyani; Zhang, Jiayang; Wang, Runsheng; Katoozi, Mehdi; Cannon, Ethan H.; Huang, Ru; Cao, Yu
30-May-2022Efficacy and Safety of Initial 5Years of Adjuvant Endocrine Therapy in Postmenopausal Hormone Receptor-Positive Breast Cancer: A Systematic Review and Network Meta-AnalysisLiao, Hao; Pei, Wendi; Zhong, Jianxin; Shao, Bin; Liu, Xiaoran; Liu, Yaxin; Zhang, Jiayang; Rugo, Hope S.; Li, Huiping
13-Apr-2022Germline Mutational Landscape in Chinese Patients With Advanced Breast CancerZhang, Jiayang; Wang, Nan; Zheng, Tiantian; Lu, Tan; Zhang, Ruyan; Ran, Ran; Li, Kun; Huang, Yong; Xie, Feng; Zhang, Yue; Jia, Shidong; Yu, Jianjun; Li, Huiping
Apr-2020Hot Carrier Degradation-Induced Dynamic Variability in FinFETs: Experiments and ModelingYu, Zhuoqing; Sun, Zixuan; Wang, Runsheng; Zhang, Jiayang; Huang, Ru
2018Investigation of DIBL Degradation in Nanoscale FinFETs under Various Hot Carrier StressesSun, Zixuan; Yu, Zhuoqing; Wang, Runsheng; Zhang, Jiayang; Zhang, Zhe; Lu, Peimin; Huang, Ru
2023Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET TechnologySun, Zixuan; Lu, Haoran; Xue, Yongkang; Luo, Wenpu; Wang, Zirui; Zhang, Jiayang; Ji, Zhigang; Wang, Runsheng; Huang, Ru
2023Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET TechnologySun, Zixuan; Lu, Haoran; Xue, Yongkang; Luo, Wenpu; Wang, Zirui; Zhang, Jiayang; Ji, Zhigang; Wang, Runsheng; Huang, Ru
Feb-2023Investigation of the Off-State Degradation in Advanced FinFET Technology & mdash;Par t I: Experiments and AnalysisSun, Zixuan; Wang, Zirui; Wang, Runsheng; Zhang, Lining; Zhang, Jiayang; Zhang, Zuodong; Song, Jiahao; Wang, Da; Ji, Zhigang; Huang, Ru
2019Investigation on the Lateral Trap Distributions in Nanoscale MOSFETs During Hot Carrier StressSun, Zixuan; Yu, Zhuoqing; Zhang, Zhe; Zhang, Jiayang; Wang, Runsheng; Lu, Peimin; Huang, Ru
12-Apr-2021The miR-124-3p/Neuropilin-1 Axis Contributes to the Proliferation and Metastasis of Triple-Negative Breast Cancer Cells and Co-Activates the TGF-beta PathwayZhang, Jiayang; Zhang, Xuesong; Li, Ziyi; Wang, Qingshan; Shi, Yan; Jiang, Xian; Sun, Xueying
2018New insights into the HCI degradation of pass-gate transistor in advanced FinFET technologyRen, Pengpeng; Liu, Changze; Wan, Sanping; Zhang, Jiayang; Yu, Zhuoqing; Liu, Nie; Sun, Yongsheng; Wang, Runsheng; Zhan, Canhui; Gan, Zhenghao; Wong, Waisum; Xia, Yu; Huang, Ru
2017New Insights into the Hot Carrier Degradation (HCD) in FinFET: New Observations, Unified Compact Model, and Impacts on Circuit ReliabilityYu, Zhuoqing; Zhang, Jiayang; Wang, Runsheng; Guo, Shaofeng; Liu, Changze; Huang, Ru
2018New insights into the hot carrier degradation (HCD) in FinFET: New observations, unified compact model, and impacts on circuit reliabilityYu, Zhuoqing; Zhang, Jiayang; Wang, Runsheng; Guo, Shaofeng; Liu, Changze; Huang, Ru