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Issue Date | Title | Author(s) |
Aug-2021 | Activity of preclinical and phase I clinical trial of a novel androgen receptor antagonist GT0918 in metastatic breast cancer | Li, Huiping; Song, Guohong; Zhou, Qiaoxia; Ran, Ran; Jiang, Hanfang; Zhang, Ruyan; Liu, Yaxin; Zhang, Jiayang; Meng, Luping; Ma, Liandong; Sun, Ye; Wang, Meiyu; Zhou, Qingqing; Yan, Honghua; Zhou, Qianxiang; Dong, Xunwei; Tong, Youzhi |
Feb-2023 | Adaptive Multioutput Gradient RBF Tracker for Nonlinear and Nonstationary Regression | Sun, Zixuan; Wang, Zirui; Wang, Runsheng; Zhang, Lining; Zhang, Jiayang; Zhang, Zuodong; Song, Jiahao; Wang, Da; Ji, Zhigang; Huang, Ru |
Sep-2021 | Aging-Aware Gate-Level Modeling for Circuit Reliability Analysis | Zhang, Zuodong; Wang, Runsheng; Shen, Xuguang; Wu, Dehuang; Zhang, Jiayang; Zhang, Zhe; Wang, Joddy; Huang, Ru |
3-Jan-2025 | Anlotinib in combination with metronomic chemotherapy in HER2-negative metastatic breast cancer: an observational and retrospective study | Liu, Jiaxuan; Zhang, Jiayang; Li, Huiping; Song, Guohong; Di, Lijun; Jiang, Hanfang; Yan, Ying; Wang, Huan; Wang, Jing; Liu, Xiaoran; Shao, Bin; Li, Qiao |
Jan-2022 | Body Bias Dependence of Bias Temperature Instability (BTI) in Bulk FinFET Technology | Zhang, Jiayang; Wang, Zirui; Wang, Runsheng; Sun, Zixuan; Huang, Ru |
2018 | Body Bias Dependence of Hot Carrier Degradation (HCD) in Advanced FinFET Technology | Zhang, Jiayang; Sun, Zixuan; Wang, Runsheng; Yu, Zhuoqing; Ren, Pengpeng; Huang, Ru |
2020 | CIRCUIT RELIABILITY EVALUATION OF APPROXIMATE COMPUTING | Zhang, Yuwei; Zhang, Zuodong; Zhang, Zhe; Zhang, Jiayang; Wang, Runsheng; Ling, Zhiting; Huang, Ru |
2018 | Compact Modeling and Simulation of Accelerated Circuit Aging | Patra, Devyani; Zhang, Jiayang; Wang, Runsheng; Katoozi, Mehdi; Cannon, Ethan H.; Huang, Ru; Cao, Yu |
30-May-2022 | Efficacy and Safety of Initial 5Years of Adjuvant Endocrine Therapy in Postmenopausal Hormone Receptor-Positive Breast Cancer: A Systematic Review and Network Meta-Analysis | Liao, Hao; Pei, Wendi; Zhong, Jianxin; Shao, Bin; Liu, Xiaoran; Liu, Yaxin; Zhang, Jiayang; Rugo, Hope S.; Li, Huiping |
13-Apr-2022 | Germline Mutational Landscape in Chinese Patients With Advanced Breast Cancer | Zhang, Jiayang; Wang, Nan; Zheng, Tiantian; Lu, Tan; Zhang, Ruyan; Ran, Ran; Li, Kun; Huang, Yong; Xie, Feng; Zhang, Yue; Jia, Shidong; Yu, Jianjun; Li, Huiping |
Apr-2020 | Hot Carrier Degradation-Induced Dynamic Variability in FinFETs: Experiments and Modeling | Yu, Zhuoqing; Sun, Zixuan; Wang, Runsheng; Zhang, Jiayang; Huang, Ru |
2018 | Investigation of DIBL Degradation in Nanoscale FinFETs under Various Hot Carrier Stresses | Sun, Zixuan; Yu, Zhuoqing; Wang, Runsheng; Zhang, Jiayang; Zhang, Zhe; Lu, Peimin; Huang, Ru |
2023 | Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology | Sun, Zixuan; Lu, Haoran; Xue, Yongkang; Luo, Wenpu; Wang, Zirui; Zhang, Jiayang; Ji, Zhigang; Wang, Runsheng; Huang, Ru |
2023 | Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology | Sun, Zixuan; Lu, Haoran; Xue, Yongkang; Luo, Wenpu; Wang, Zirui; Zhang, Jiayang; Ji, Zhigang; Wang, Runsheng; Huang, Ru |
Feb-2023 | Investigation of the Off-State Degradation in Advanced FinFET Technology & mdash;Par t I: Experiments and Analysis | Sun, Zixuan; Wang, Zirui; Wang, Runsheng; Zhang, Lining; Zhang, Jiayang; Zhang, Zuodong; Song, Jiahao; Wang, Da; Ji, Zhigang; Huang, Ru |
2019 | Investigation on the Lateral Trap Distributions in Nanoscale MOSFETs During Hot Carrier Stress | Sun, Zixuan; Yu, Zhuoqing; Zhang, Zhe; Zhang, Jiayang; Wang, Runsheng; Lu, Peimin; Huang, Ru |
12-Apr-2021 | The miR-124-3p/Neuropilin-1 Axis Contributes to the Proliferation and Metastasis of Triple-Negative Breast Cancer Cells and Co-Activates the TGF-beta Pathway | Zhang, Jiayang; Zhang, Xuesong; Li, Ziyi; Wang, Qingshan; Shi, Yan; Jiang, Xian; Sun, Xueying |
2018 | New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology | Ren, Pengpeng; Liu, Changze; Wan, Sanping; Zhang, Jiayang; Yu, Zhuoqing; Liu, Nie; Sun, Yongsheng; Wang, Runsheng; Zhan, Canhui; Gan, Zhenghao; Wong, Waisum; Xia, Yu; Huang, Ru |
2017 | New Insights into the Hot Carrier Degradation (HCD) in FinFET: New Observations, Unified Compact Model, and Impacts on Circuit Reliability | Yu, Zhuoqing; Zhang, Jiayang; Wang, Runsheng; Guo, Shaofeng; Liu, Changze; Huang, Ru |
2018 | New insights into the hot carrier degradation (HCD) in FinFET: New observations, unified compact model, and impacts on circuit reliability | Yu, Zhuoqing; Zhang, Jiayang; Wang, Runsheng; Guo, Shaofeng; Liu, Changze; Huang, Ru |