Title | Thickness histogram and statistical harmonic representation for 3D model retrieval |
Authors | Liu, Yi Pu, Jiantao Zha, Hongbin Liu, Weibin Uehara, Yusuke |
Affiliation | Natl. Lab. on Machine Perception, Peking University, Beijing 100871, China Internet Application Lab., Fujitsu R and D Center Co., Ltd. Language Processing Lab., Information Technology Media Lab., Fujitsu Laboratories Ltd. |
Issue Date | 2004 |
Citation | Proceedings - 2nd International Symposium on 3D Data Processing, Visualization, and Transmission. 3DPVT 2004.Thessaloniki, Greece. |
Abstract | Similarity measuring is a key problem for 3D model retrieval. In this paper, we propose a novel shape descriptor 'Thickness Histogram' (TH) by uniformly estimating thickness of a model using statistical methods. It is translation and rotation-invariant, discriminative to different shapes, and very efficient to compute with the Shape Distribution (SD) proposed by Osada etc. For high performance of the retrieval, we propose a robust method for translating the directional form of the statistical distribution to the harmonic representation. By summing up energies at different frequencies, a matrix shape signature is formed to provide an exhaustive characterization of 3D geometry. Experiments show that the performance of the statistical harmonic representation is among the top ones of existing shape descriptors. ? 2004 IEEE. |
URI | http://hdl.handle.net/20.500.11897/329205 |
Indexed | EI |
Appears in Collections: | 机器感知与智能教育部重点实验室 |