半导体激光在色素痣二氧化碳激光术后复发者中的应用

Abstract

目的观察半导体激光应用于二氧化碳激光术后复发的色素痣的疗效。方法选取曾接受过一次二氧化碳激光治疗且复发的面部色素痣患者86例(皮损共计128个),随机分为两组,观察组44例(皮损67个)采用800 nm半导体激光治疗,对照组42例(皮损61个)继续采用二氧化碳激光治疗。治疗结束后每3个月患者复诊,由两名医生进行疗效评价,同时评价继发瘢痕情况。结果两组资料每次治疗后治愈率对比无显著差异(P> 0.05);治愈后瘢痕评价对比有显著差异(P <0.05)。结论对于二氧化碳激光术后复发的色素痣,采用半导体激光治疗与二氧化碳激光继续治疗对比同样有效,但术后瘢痕评价前者优势明显,因此认为半导体激光用于复发性色素痣的治疗,安全有效。

Objective To observe the effect of diode laser on recurrent pigmented nevus after CO_2 laser surgery. Methods 86 patients with facial pigmented nevus who recently received CO_2 laser treatment but relapsed(128 lesions) were randomly divided into two groups. The observation group of 44 cases(67 lesions) used 800 nm diode laser. The control group of 42 cases(61 lesions) continued to be treated with carbon dioxide laser.After the eventual therapy, the patient would take a re-examination every 3 months with two doctors evaluating the efficacy and the condition of resulting scars. Results There was no significantly therapeutic difference between two groups(P > 0.05). There was a markedly visible difference in the evaluation of scar after treatment(P < 0.05). Conclusion For the recurrent pigmented nevus after CO_2 laser, the treatment of diode laser was as effective as the continuous treatment of CO_2 laser. However, the preoperative scar evaluation had obvious advantages. Therefore, it was considered safe and effective to use diode laser for the treatment of recurrent pigmented nevus..